Agilent Technologies
Power of X for component tests Webcast - Wednesday 10th February at 1pm GMT
Time to market, MIPI, DigRF, digital, baseband, linear/nonlinear active devices, characterization… Does it sound familiar? Then you may want to attend the following webcast!
Start date/time
:
10-Feb-2010 1pm GMT
End date/time : 10-Feb-2010 2pm GMT
Venue : On the Phone
Organiser name : Agilent Technologies
Organiser email : tm_uk@agilent.com
Organiser tel : 01189 276201
End date/time : 10-Feb-2010 2pm GMT
Venue : On the Phone
Organiser name : Agilent Technologies
Organiser email : tm_uk@agilent.com
Organiser tel : 01189 276201
Power of X for component tests Webcast
This webcast will dive into some of the tests required to characterize the different components to be
used within a wireless device. First, we’ll have a look at the next generation of mobile handset designs
where the key interface between baseband and RF is all digital and standardized. Then the second half
of the presentation will focus of the characterization of non
superset of the well
value of the Agilent RDX solution for MIPI testing and PNA
-linear components thru X-parameters,-known S-parameters. In less than an hour, you should be able to see the added-X for measurements on non-linear devices.The power to get to market faster
Speakers:
Jean -Manuel Dassonville EMEA Market Development Manager for Network Analysis
Giovanni d’Amore
To register for these Webcasts, please go to www.agilent.com/find/lte_webcasts
, Product Manager for the RDX Solution supporting DigRF/MIPI- Wednesday 10th February at 1pm GMT