Agilent Technologies
Agilent Technologies: Moving to non-signaling manufacturing test for wireless devices
Agilent Technologies invites you to our live web seminar so that you can stay up to date with the latest technologies and solutions.
End date/time : 13/06/2012 16:00
Venue : At Your Desk!
Organiser name : Agilent Technology
Organiser email : TM_UK@agilent.com
Organiser tel : 01189 276201
Why this web seminar is important
As wireless devices rapidly evolve, more wireless bands and formats are being implemented on chipsets used in smart phones, tablets, and other wireless communication devices. Manufacturers are looking for cost-effective ways to test these complex devices while moving them quickly into volume manufacturing. Non-signaling test is widely accepted as the fastest, most cost-effective technique for testing current and next-generation wireless devices in manufacturing. This presentation discusses the requirements to effectively implement non-signaling test including:
- What is non-signaling test?
- Chipset test capabilities, now and future
- Required test equipment capabilities
- Tools and techniques to maximize throughput
with minimum effort
Who should view this web seminar
Test engineers and managers responsible for developing the test processes for smart phones, tablets, other wireless devices.
