The seminar objective is to provide an overview of the state-of-art techniques used to measure the impedance and the dielectric properties of materials that are widely incorporated into microwave devices and components. We will start form the basis of measuring the impedance of components and material following an overview the most relevant techniques used to measure large range of materials from few MHz to THz.
We will look as well the new techniques to measure impedance at nanoscale and at very high frequency using novel technologies. Application and product experts from Keysight will be on-hand to give demonstrations and technical presentations around the latest innovations, features and capabilities.
Content that will be covered include:
Challenges and Solution for Impedance Measurement
This session is aimed to focus on basic impedance measurement and its applications. An overview of the techniques for making accurate impedance measurements on components such as capacitors, inductors and transformers will be presented. You will gain an understanding on the reasons for measurement discrepancies, the sources of measurement error and how to compensate for these errors.
Novel Devices and Material Characterisation at mm-wave and Terahertz
From stealth materials to dielectric substrates, microwave food products to biofuels, accurate characterisation of their electromagnetic properties at microwave and mm-wave frequencies provide engineers with critical information needed for material and circuit design, modelling, research, manufacturing and quality control.
Investigation of local electrical properties at the nanoscale using Scanning Microwave Microscopy (SMM) Part A:
Introduction to Scanning Microwave Microscopy Scanning microwave microscopy (SMM) is a novel approach combining an atomic force microscope (AFM) with a performance network analyzer (PNA). SMM enables the measurement of complex impedance at the nanoscale with operating frequencies ranging from 1 MHz to 20 GHz, with sensitivity levels of ~1 aF. Employing a low frequency modulation technique expands the method to measure dopant densities of semiconductor devices with dynamic range from 1015 atoms/cm3 to 1020 atoms/cm3.
Part B: Applications of Scanning Microwave Microscopy We will present applications of SMM from a variety of research areas including semiconductor devices, high –K materials, carbon nanotubes & graphene, thin films, sub-surface imaging, and biological samples.
Who should attend:
R&D, QA, Design and Manufacturing Engineers. Researchers who are working with materials and designing state-of-the-art electronic devices and components
Agenda
8.45 - Welcome & Registration
9.00 - Challenges and Solution for Impedance Measurement
10.30 – Break
10.45 - Novel Devices and Material Characterisation at mm-wave and Terahertz
12.15 - Lunch
13.00 - Investigation of local electrical properties at the nanoscale using Scanning Microwave Microscopy (SMM)
14.30 - Close
