Testing
The Cambridge Wireless Testing Special Interest Group
While still necessary to ensure that the basic functionality of wireless technologies works as it should, conformance testing and testing against specifications are no longer sufficient to ensure that a wireless device will deliver a reliable and satisfactory customer experience.
The Cambridge Wireless Testing Special Interest Group purpose is to question the current testing regimes and move beyond them to explore new techniques better suited to the real world, where it is impossible to predict the precise details of the environment in which the device will be used.
The Cambridge Wireless Testing SIG intends to meet three times per year with the aim to create a requirement driven adaptable SIG where members and other testing professionals have a platform to share their knowledge and experience and the opportunity to discover the experiences of others.
This SIG is championed by:
Dr. Allan MacLean of Amdeo
Steven Edwards of Rohde-Schwarz
Bill Burrows of Aeroflex
Ultimately, this forum aims to enable its members to re-examine the test programmes currently employed in the wireless world and continuously improve quality in the end product whatever it may be.
If there are any queries or if you would like to contact any of the SIG Champions, please email admin@cambridgeshirewireless.co.uk
Recent Event
Inaugural SIG - "Testing for the Real World" 5th March, St John's Innovation Centre
To view the presentations at this event, follow the links below......
We regret that the presentation from Google is not available for viewing.
Next Event
Joint Testing SIG and DCKTN Event - ‘Open Forum: Addressing the Challenges of Automated Testing’ This event tackles the benefits and pitfalls of automation by engaging delegates to take part in an interactive debate. Its aim is to discover a realistic route to bringing products/services to market as fast and efficiently as possible. Lively discussion is guaranteed, book now to have your say and take part in the dialogue. This SIG is championed by Allan Maclean of Amdeo, Steve Edwards of Rohde-Schwarz, Bill Burrows of Aeroflex and Mike Salmon of IOTAS in partnership with the Digital Communication KTN. This event is kindly hosted by PriceWaterhouseCoopers. As an industry we are under enormous pressure to get increasingly complex products and services to market more quickly and at lower cost. Automation of testing is one important way of addressing this objective, but getting effective automation in place is fraught with difficulties such as ensuring the most appropriate foci for automation, ensuring that reliable results are produced and understanding the trade-offs between set-up costs and increased efficiency down the line.
Previous Testing SIG events have received excellent feedback for their lively panel sessions so in a departure from our traditional SIG format, this event will allow more interaction and audience participation than usual. After a brief introduction to some of the issues around automation, the event will continue with an Open Forum chaired by Stuart Revell, Chair, DCKTN Wireless Technology & Spectrum Working Group and continue with the following confirmed panellists:
We would like to ensure that this event has plenty of structured discussion around the issues to do with automating testing that are of greatest concern to the community. We would therefore encourage participants to submit questions, comments or issues that they would like to have addressed to Clare Kettle, (clare.kettle@cambridgewireless.co.uk) We will collate the input we receive and use it as the framework to address specific issues in the meeting.
To be able to attend this event for free you'll automatically be registered as a DCKTN member. Please note membership of the DCKTN is free. To join Cambridge Wireless, and attend all future events for free please visit: http://www.cambridgewireless.co.uk/sign-up/
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03/11/10 | ||||||||||||
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