Testing

While still necessary to ensure that the basic functionality of wireless technologies works as it should, conformance testing and testing against specifications are no longer sufficient to ensure that a wireless device will deliver a reliable and satisfactory customer experience. 
The Cambridge Wireless Testing Special Interest Group purpose is to question the current testing regimes and move beyond them to explore new techniques better suited to the real world, where it is impossible to predict the precise details of the environment in which the device will be used.
 
The Cambridge Wireless Testing SIG intends to meet three times per year with the aim to create a requirement driven adaptable SIG where members and other testing professionals have a platform to share their knowledge and experience and the opportunity to discover the experiences of others.  

This SIG is championed by: 

Dr. Allan MacLean of Amdeo                  
Steven Edwards of Rohde-Schwarz
Mike Salmon of IOTAS                 
Ultimately, this forum aims to enable its members to re-examine the test programmes currently  employed in the wireless world and continuously improve quality in the end product whatever it may be.
If there are any queries or if you would like to contact any of the SIG Champions, please email admin@cambridgeshirewireless.co.uk 
Recent Event

A joint event between Digital Communications KTN and Cambridge Wireless Testing SIG “Open Forum: Addressing the Challenges of Automated Testing” 3rd November 2010 at PwC

To view the presentation at this event, click on the link below......
  • “Challenges of Test Automation – Achieving an ROI, what to avoid, success factors and pitfalls” Stuart Thomas, Head of Software and Consultancy at RFI Global Services

    The following papers were referred to in the panel session:

    • The papers mentioned by Stuart Revell can be found on the DCKTN site:

     

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