The Cambridge Wireless Testing Special Interest Group
While still necessary to ensure that the basic functionality of wireless technologies works as it should, conformance testing and testing against specifications are no longer sufficient to ensure that a wireless device will deliver a reliable and satisfactory customer experience.
The Cambridge Wireless Testing Special Interest Group purpose is to question the current testing regimes and move beyond them to explore new techniques better suited to the real world, where it is impossible to predict the precise details of the environment in which the device will be used.
The Cambridge Wireless Testing SIG intends to meet three times per year with the aim to create a requirement driven adaptable SIG where members and other testing professionals have a platform to share their knowledge and experience and the opportunity to discover the experiences of others.
This SIG is championed by:
Dr. Allan MacLean of Amdeo
Ultimately, this forum aims to enable its members to re-examine the test programmes currently employed in the wireless world and continuously improve quality in the end product whatever it may be.
Recent Event
Inaugural SIG - "Testing for the Real World" 5th March, St John's Innovation Centre
Click on the titles below to view the presentations
We regret that the presentation from Google is not available for viewing.
Next Event
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