This seminar is part of the Keysight Insight Seminar Series and presents several aspects of research carried out in the EMRP IND51 "MORSE "Metrology for optical and RF communication systems” project. The EMRP is jointly funded by the EMRP participating countries within EURAMET and the European Union.
Automotive radar, multi-gigabit connectivity are just some of the emerging application in the mm-wave bands, employing state-of-the-art planar and smart antenna systems and with the continuous increase in the speed of low-cost technologies like RF CMOS and BiCMOS, complex mm-wave systems are becoming a reality. To address the needs of such applications mm-wave characterization should cover all the aspects from material characterization, to antenna element measurements up to the verification of smart antenna systems.
In this seminar we will review the pitfall and solutions adopted in various mm-wave characterization laboratories throughout Europe, ranging from near-field, compact-range and far-field setups, addressing both the connectorized and the on-wafer world, with their unique features and problems. See web for detailed agenda
Registration https://www.keysight.com/main/editorial.jspx?cc=GB&lc=eng&ckey=2586639&id=2586639
Marco Spirito, Event organiser, T U Delft, M.Spirito@tudelft.nl
David Humphreys, JRP Coordinator, NPL, david.humphreys@npl.co.uk
