As electronic systems become increasingly complex and interdependent, the possibility of interactions between systems and subsystems that could lead to unintended consequences is a serious concern.

However qualifying functional complex electronic systems and products for reliable performance under a given life cycle history is a difficult task, because of the complex aggregation of potential failure sites and failure modes.

The current approach, driven by industry specifications and standards, is to conduct standardized tests that are intended to represent a compressed version of reprentative life cycles. The problem is that there is no clear articulation of what failure mechanisms are being targeted. Consequently, it is not clear what the acceleration factor is likely to be.

As a design's complexity increases the ability to verify it goes non-linear. Engineers continue to innovate by increasing the complexity of their designs but struggle to come up with new techniques to ensure their designs can work under a broad set of operating conditions in the field.

So does the increasing complexity make existing techniques obsolete or is there a new approach needed that can combine several methods creating a holistic approach to system level reliability?

Speakers

Speakers will include a range of experts from both the design and equipment manufacturing sectors with a few case studies from both end user OEM's.

There are still a few speaking opportunities available. Please contact Patrick McNamee at NMI to discuss.

Expected audience

This Event is the latest in an annual series of NMI reliability events that has grown in popularity each year.

This will appeal too much of the NMI's membership and is expected to draw manager's designers and engineers from across the full spectrum of NMI members.

Exhibition Opportunity

Sponsoring or exhibiting at the NMI reliability conference will bring about a number of benefits for your organization enabling you to reach an audience of managerial and technical decision makers involved in system reliability manufacturing and design.

If you are interested in Sponsorship or Exhibition opportunities at this Event, please contact Patrick McNamee at NMI to discuss.