Event: Solutions for IoT Test Challenges

Published by Tektronix UK

We are pleased to offer, in partnership with Farnell, a hands on demonstration with the latest test and measurement solutions that unlock insights and drive discovery in the IoT Space.

Solution for IoT Test Challenges Discussion topics for the day - Solutions for IoT test challenges: IoT product design – leveraging the many IoT system modules Maximizing your device’s battery life Debug complex digital/analog/RF system problems Speeding your device through EMC compliance Speeding your device through Wireless certification Preparing for IoT network deployment

27th April 9:30am - Registration and coffee 10am to 12:15am - Workshop 12:15am to 1pm - Lunch Seminar Room, Department of Electrical Engineering, 9 JJ Thompson Avenue, Cambridge CB3 0FA Spaces at the event are limited, register today to secure your place.

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