Registration and networking with refreshments
Welcome & Introduction from Paul Crane, CEO, Cambridge Wireless
Welcome from our sponsor and host, Dave Yates, Qualcomm Technologies International
Session 1: Session chaired by Radio Technology SIG Champion
Tim Newton, CTO, RFcreations
‘Why I have trouble with spectrum analysers!’
A potted history of spectrum analysers from CRTs to modern digital analysers, explaining the evolution of terminology and the perplexing controls which confront us today. The talk will be illustrated by references to the use of spectrum analysers in the Bluetooth test specification.
Gareth Lloyd, Individual Contributor, Rohde & Schwarz
‘DIY Load-Pull using an Oscilloscope and Vector Signal Generator’
We set out to build a Load Pull test bench using off-the-shelf Test & Measurement instruments. Specifically, an RF Oscilloscope and a Vector Signal Generator. This is what we learned.
Jonathan Borrill, CTO, Anritsu
‘Exploring the outer limits of Spectrum Analysis’
In this discussion we will look at the fundamental architecture of a Spectrum Analyser, stopping briefly for some mathematical brain teasers, before then exploring how we can take this technology to the outer limits of RF measurement that sits in the sub-THz bands. The design, implementation, and measured results from a Proof of Concept demonstrator will be presented and discussed.
Networking lunch over displays
Session 2: Chaired by Peter Topham, Principal Engineer, Qualcomm Technologies International & Radio Technology SIG Champion
Kauser Chaudhry, Compound Semiconductor Applications Catapult
‘Power Amplifier Linearity Measurement for 5G and Satcom Applications’
Power Amplifiers (PAs) are critical components for communication systems, the PAs amplify the transmitted signal to adequate levels, ensuring the signal is detected by the receiving device, regardless of distance or obstacles. With the growing demand for data, modern communication signals like 5G and broadband satellite communication (Satcom) have complex modulation schemes and wider bandwidth. This complexity makes it more challenging to design power amplifiers that meet performance standards, including efficiency, output power, gain, and linearity.
Dr Geoff Hilton, Senior Lecturer, University of Bristol
‘In assessing the antenna performance, are far-field azimuth and elevation radiation patterns sufficient?’
Commercial antenna manufactures’ data sheets supply you with a plethora of useful information including bandwidth of operation, antenna gain, and generally the azimuth and elevation radiation patterns (or sometimes even three orthogonal planes). While this is maybe sufficient for some applications, what useful information that could significantly affect the communications link performance could be missing from this? In this talk a number of examples of antennas for operation both indoor and outdoor operation are presented and identifies situations where the antenna environment (the unit in which the antenna is housed or the location of the unit as a whole) becomes the dominant mechanism for shaping the radiation pattern. The need for full polarimetric radiation pattern measurements and the range of error that could occur with a limited measurement dataset is discussed.
Sam Darwish, VIAVI Solutions
‘Smarter Installation and Troubleshooting’
Sam will share how VIAVI Solutions have been supporting their customers to speed up deployments and also how they have helped troubleshoot using a tried and tested method. The work VIAVI have done has reduced the time to optimise sites and also reduced the amount of revisits and components swaps to get sites performing.
Clive Barnett, Solution Engineer, Keysight
‘Gaining Efficiency in the Calibration and Verification of Phased Array Antennas (for Satellite Communication)’
Modern satellite networks operate at higher frequencies and use active phased array antenna systems which are driving ubiquitous connectivity and sensing requirements of next-generation satellite communication. Phased array antennas use electronic means to steer beams to precise locations to improve overall reliability. Testing these highly integrated systems is a complex and time-consuming task. Designers and manufacturers need fast OTA testing to efficiently calibrate and verify the performance of phased arrays.
Closing remarks and event ends