Keysight Technologies to Showcase Semiconductor Parametric, Modeling Solutions at IRPS 2015

Solutions Help Designers Characterize and Model Cutting-Edge CMOS and Compound Semiconductor Devices
SANTA ROSA, Calif., April 16, 2015

Keysight Technologies, Inc. (NYSE: KEYS) today announced it will demonstrate some of its many semiconductor parametric and modeling solutions at the 53rd International Reliability Physics Symposium (IRPS), Hyatt Regency Monterey Resort, Booth 203/205, Monterey, Calif., April 19-23.

IRPS is the world's premier platform for presenting pioneering work in semiconductor reliability. The 2015 technical program consists of platform and poster presentations. Four different tutorial tracks, three reliability year-in-review talks, six workshops, a panel discussion and an equipment exhibit will complement this year's program.

Keysight application experts will be on hand to demonstrate:

Keysight end-to-end solutions for semiconductor device characterization and SPICE model extraction that include automatic on-wafer measurement, 1/f noise and RTN measurement, advanced model extraction flows, and automatic and intelligent qualification of SPICE libraries

The B1500A Semiconductor Device Analyzer, which now offers software and hardware enhancements that greatly improve performance and usability for parametric test

The B1506A Power Device Analyzer for Circuit Design, which can measure all power device datasheet parameters up to 3 kV/1500 A and also calculate power loss

The B2900A Benchtop SMU, which provides a cost-effective solution with color GUI and a wide measurement range, such as 210 V and 3 A (DC) or 10.5 A (pulsed)

Additional information is available at www.irps.org .