EMC Measurement Seminar: Optimising Compliance and Diagnostic Testing

Join Keysight, Microlease and EMSCAN at our EMC Measurement seminar, where you can meet, engage and network with industry experts. This seminar shall run on two separate dates, in different locations. You can specify which date you would like to attend when registering.

Spaces for this seminar are limited, so please ensure that you register as soon as possible in order to secure your place.

Locations

18th November 2015, 9:30-17:00 - Keysight UK, Winnersh, Berkshire, UK

19th November 2015, 9:30-17:00 - National Space Centre, Leicester, UK

Agenda

09:30 – 10:00 Registration & Tea/Coffee

10:00 –10:45 Streamline EMC Testing with Prescan Analysis Tools (Mark Terrien, EMC Business Manager, Keysight Technologies)

10:45 – 11:15 Tea & Coffee, Networking and Product Demonstrations

11:15 – 12:30 The world’s fastest high resolution scanning technique that can pinpoint emissions from inside an IC or microchip (Ruska Patton, Director Product Management, EMSCAN)

12:30 – 14:00 Lunch, Networking and Product Demonstrations

14:00 – 15:00 Improve EMC Compliance Testing Throughput with Time Domain Scanning (Mark Terrien, EMC Business Manager, Keysight Technologies)

15:00 – 17:00 Tea & Coffee, Networking and Product Demonstrations EMC

Clinic – On request & by appointment, bring your PCB/DUT for measurement insight.

Abstracts

Streamline EMC Testing with Prescan Analysis

One important tool used to reduce EMC compliance and pre compliance test time is pre-scanning the device under test with a fast detector to identify suspect emissions prior to final measurement with weighted detectors. This paper explores amplitude and frequency accuracy issues associated with traditional EMC pre-scanning and discusses how analysis tools like spectrum analysis and IF monitoring can be used to improve pre-scan results, saving test time and enhancing final measurement result accuracy. The world’s fastest high resolution scanning technique that can pinpoint emissions from inside an IC or microchip The very-near-field scanning method based on an array of probes provides real time visualization of the spatial distribution of emissions from PCBs but lack the ability to do very high resolution scanning. Single probe mechanically swept solutions can do very high resolution scanning but they are extremely slow. A new method that combines the array of sensors with mechanical motion combines the benefits of both techniques and provides the fastest high resolution scanning available. This presentation will show a working system that implements this combined technique and explain how the system is able to peer inside an IC and isolate the radiation from individual pins and wire bonds. Testing from real world PCBs with multiple sources of emission will be presented. Designers who are integrating high speed ICs and are responsible for meeting emission targets should attend. This will also be of interest to chip manufacturers who want to ensure their products do not contribute to excessive emission in sample designs and in end-customer designs.

Improve EMC Compliance Testing Throughput with Time Domain Scanning Modern EMI compliance receivers and pre compliance analyzers offer Time Domain Scanning to reduce overall measurement time and improve test house efficiency. This paper describes how Time Domain Scanning works and explores associated measurement issues and receiver design considerations. With this information, users will have a better understanding of how to use this technology to improve their testing efficiency and test lab throughput.

To register: http://www.keysight.com/main/eventDetail.jspx?cc=GB&lc=eng&ckey=2611407&nid=-33166.920244.08&id=2611407